PVS-5000 is a high throughput, field proven PV Wafer Inspection and Sorting System.
It combines high reliability wafer handling with Semilab’s industry leading PV metrology, to provide a turnkey solution for sorting of incoming wafers. This is backed by direct expert support from the OEM metrology manufacturer, through our worldwide network of branch offices.
- Eliminating damaged wafers from further process
- Eliminating high thickness variation wafers (TTV, sawmark)
- Sorting of potentially weak wafers (microcracks) which could break in subsequent process steps
- Sorting based on resistivity, and lifetime values
- Sorting of wafers with dislocations, high contamination and vacancy density
- Wafer input: loading from cassettes or stack
- Wafer output: Sorting in different user-defined classes, collection in coinstacks
- High throughput