PV-2000 is the world’s most powerful PV metrology system.PV-2000_300x226_0

It is a new integrated platform with the following capabilities:

  • SPV Diffusion Length
  • Noncontact C-V
  • Accelerated LID testing
  • QSS-μPCD

Other testing capabilities:

  • SPV Surface Lifetime
  • SPV Mapping of Rshunt and Voc
  • Noncontact Suns-Voc
  • Wafer Thickness Measurement