This group consist of products that are capable of measuring different properties of crystalline solar cell smaterial. All of these prodcts are capable of measuring in on point at a time. The position of the measurement is freely chosen by the operator.
The RT family measures resistivity of silicon feedstock material, blocks and wafers. Options are P/N tester and wafer thickness measurements.
WT-1000B and WT-1200 measure lifetime on blocks and wafers, respectively.
SHR-1000 measures sheet resistance of diffused wafers. Reflectance measurement is optional.
PN-100 measures conductivity type.