Semilab offers a bunch of solutions for mapping measurements of materials at each step of crystalline solar cell production.

WT-2000PVN is suitable for measuring blocks, wafers of all preparation levels and solar cells.

WT-2000D is designed to make maps of blocks. It can be used either manually or by robotic loading. (Robots are not provided by Semilab.)

C.FORS is a high-end, low noise SPV measurement tool specially designed for the photovoltaic industry

IRB-30 is a fast and powerful tool for measuring defects in multicrystalline silicon blocks. It can determine the cut position of a block.