The NHT3 is designed to provide low loads with depth measurements in the nanometer scale for the measurement of hardness, elastic modulus, creep, etc. The system can be used to characterize organic, inorganic, hard and soft materials. With the unique top surface referencing technique, an indentation measurement can be made in less than 3 minutes without waiting for thermal stabilization.NHT2-Module-01-300x220

Quick and efficient indentation measurements

  • Unique top-referencing surface determination
  • Automated optical microscope camera inspection before and after testing
  • Feedback-controlled normal force
  • Differential capacitive measurement of indentation depths
  • PC software package for automated data acquisition, storage and evaluation

Options:

  • Vacuum or environmental control enclosure
  • Atomic Force Microscope (AFM)
  • Sinus mode
  • Liquid cell